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Glossary

1,184 technical terms and definitions

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Showing page 24 of 24 (1,184 entries)

Extest

extest, advanced test & probe

EXTEST is a boundary-scan instruction that drives and samples external pins for interconnect testing - Boundary cells force output patterns and capture returning values to verify…

Extract

information, parse

Sentiment Analysis Overview Sentiment Analysis (Opinion Mining) is the use of NLP to systematically identify, extract, and quantify affective states and subjective information. It…

Extreme Low-K

elk dielectric, porous dielectric, ultra low-k, sicoh

Porous low-k dielectric materials, organosilicate glass synthesis, and air-gap interconnect architectures constitute the essential back-end-of-line (BEOL) insulation technologies…

Extreme Ultraviolet Aberration Correction Machine Learning

correcting optical aberrations in extreme ultraviolet lithography systems, correcting optical aberrations, optical aberrations extreme, aberrations extreme ultraviolet

Correcting optical aberrations in extreme ultraviolet lithography systems Introduction & Motivation Correcting optical aberrations in extreme ultraviolet lithography systems…

Extreme Ultraviolet EUV Lithography

euv scanner, euv source power, euv pellicle, 13.5 nm lithography, euv stochastics

Extreme Ultraviolet lithography operates at a soft X-ray wavelength of 13.5nm where optical diffraction limits are dramatically reduced compared to 193nm immersion, yet patterning…

Extreme Ultraviolet EUV Pellicle

euv reticle protection, euv mask contamination, pellicle transmittance euv, cnt pellicle euv

EUV Pellicle is the ultra-thin protective membrane mounted above the EUV photomask surface to prevent particle contamination from landing on the mask pattern during lithography…

Extreme Ultraviolet Lithography EUV

euv pellicle, euv source power, high na euv, euv mask defect, euv stochastics

Extreme Ultraviolet lithography operates at a soft X-ray wavelength of 13.5nm where optical diffraction limits are dramatically reduced compared to 193nm immersion, yet patterning…

Extreme Ultraviolet Lithography EUV

EUV source power, EUV pellicle mask, high NA EUV, 13.5nm wavelength lithography, euv stochastics

Extreme Ultraviolet lithography operates at a soft X-ray wavelength of 13.5nm where optical diffraction limits are dramatically reduced compared to 193nm immersion, yet patterning…

Extreme-Ultraviolet-Lithography-Overlay Machine Learning

extreme ultraviolet (euv) lithography overlay and defects, extreme ultraviolet (euv), ultraviolet (euv) lithography, (euv) lithography overlay, lithography overlay defects

Extreme Ultraviolet (EUV) Lithography Overlay and Defects Introduction & Motivation Extreme Ultraviolet (EUV) Lithography Overlay and Defects addresses a central problem…

Extreme Ultraviolet Pellicle

euv pellicle membrane, pellicle transmission euv, mask protection euv, pellicle heating euv

EUV Pellicle Technology is the ultra-thin membrane (typically 40-60nm thick) suspended above the EUV photomask surface to protect it from particle contamination during exposure…

Extreme Uv EUV Photoresist

car chemically amplified resist euv, metal oxide resist euv, euv stochastic exposure, euv resist sensitivity, euv

Extreme Ultraviolet lithography operates at a soft X-ray wavelength of 13.5nm where optical diffraction limits are dramatically reduced compared to 193nm immersion, yet patterning…

Extreme-Value-Analysis-Tail Machine Learning

extreme value analysis tail, extreme value analysis, value analysis tail, extreme value, value analysis, analysis tail

Extreme Value Analysis Tail Introduction & Motivation Extreme Value Analysis Tail addresses a central problem in timeseries process control…

Extreme-Value-Capping-Mad Machine Learning

Median Absolute Deviation MAD Outlier Capping Rules Introduction & Motivation Median Absolute Deviation MAD Outlier Capping Rules addresses a central problem in {subject}…

Extreme-Value-Theory-Pot Machine Learning

Extreme Value Theory and Peaks-Over-Threshold POT Introduction & Motivation Extreme Value Theory and Peaks-Over-Threshold POT addresses a central problem in anomaly detection…

Extrinsic Gettering

process

Extrinsic Gettering (EG) is the process of deliberately introducing defects, damage, or high-doping layers on the wafer backside or in other non-critical regions to create…

Extrinsic Semiconductor

device physics

Extrinsic Semiconductor is a semiconductor whose electrical properties are dominated by intentionally introduced impurity atoms (dopants) rather than by thermally generated…

Extrusion Metal Volume Increase Prediction Machine Learning

extrusion and metal volume increase prediction, extrusion metal volume, metal volume increase, volume increase prediction, extrusion metal, metal volume, volume increase

Extrusion and Metal Volume Increase Prediction with Machine Learning Introduction & Motivation Extrusion and Metal Volume Increase Prediction with Machine Learning addresses…

Eye Closure Margin Timing Budget Prediction Machine Learning

eye closure margin timing budget prediction, eye closure margin, closure margin timing, margin timing budget, timing budget prediction, eye closure, closure margin, margin timing

Eye Closure Margin Timing Budget Prediction with Machine Learning Introduction & Motivation Eye Closure Margin Timing Budget Prediction with Machine Learning addresses a central…

Eye Diagram

signal & power integrity

Eye diagram is an overlay plot of many digital bit periods used to assess signal quality - Superimposed waveforms reveal timing and voltage margins under noise, jitter…

Eye Diagram Horizontal Eye Opening Prediction Machine Learning

eye diagram horizontal eye opening prediction, eye diagram horizontal, diagram horizontal eye, horizontal eye opening, eye opening prediction, eye diagram, diagram horizontal

Eye Diagram Horizontal Eye Opening Prediction with Machine Learning Introduction & Motivation Eye Diagram Horizontal Eye Opening Prediction with Machine Learning addresses…

Eye Diagram Margin Prediction Machine Learning

eye diagram margin prediction, eye diagram margin, diagram margin prediction, eye diagram, diagram margin, margin prediction

Eye Diagram Margin Prediction with Machine Learning Introduction & Motivation Eye Diagram Margin Prediction with Machine Learning addresses a central problem in high-speed serial…

Eyring Model

business & standards

Eyring Model is a multi-stress acceleration model that extends temperature-only analysis to include factors like voltage and humidity - It is a core method in advanced…

Enclose the Transistor

grown junction 1951 enclose transistor, hermetic can vs plastic encapsulation, moisture permeability polymer reliability, grown junction transistor enclosure choice

Enclose the Transistor: Why Plastic Doesn't Actually Close the Loop Step Twenty-Eight Opened Step twenty-eight's rinse removed mobile ionic contamination before it could drift…

Etch Machining Damaged Germanium

grown junction 1951 etch machining damage, electrolytic etch damage removal, etch depth window base width safety, grown junction transistor etch bounded window

Etch Machining-Damaged Germanium: A Depth Bounded on Both Sides Step twenty-two's margin budget set aside enough distance between each cut face and the nearest junction to contain…

Establish Furnace Atmosphere

grown junction 1951 furnace atmosphere, germanium melt oxide skin, hydrogen purge czochralski furnace, grown junction transistor protective gas

Establish Furnace Atmosphere: Purging Air Before the Charge Ever Sees Heat A molten germanium surface exposed to ordinary air doesn't contaminate the bulk melt the way a dirty…

Establish Initial N Type Composition

grown junction 1951 initial n type composition, donor acceptor balance germanium melt, compensation doping germanium charge, grown junction transistor melt charge doping

Establish Initial N-Type Composition: Setting the Donor-Acceptor Balance Before the Melt Is Even Loaded Zone-refined germanium is not electrically neutral germanium — it is…

Ethernet

hpc cluster infiniband networking, infiniband hdr edr, rdma over converged ethernet roce, verbs api rdma, opa omni path architecture

Ethernet is the dominant packet networking standard for chip-scale systems, data centers, and campus infrastructure because it provides a shared, interoperable way to move frames…

Electrical Activation Efficiency Solubility Limit Dopant Concentration

precipitation immobile cluster substitutional site, activation plateau heavy dopant arsenic boron

Activation is what actually makes an implanted dopant electrically useful: the atom has to sit on a substitutional lattice site — literally replacing a silicon atom in the crystal…

Etch Reactor Mechanical Design

chamber wall materials semiconductor, wafer stage design, vacuum seal chamber design, etch chamber engineering, wafer clamping temperature control

The mechanical design of an etch reactor is the engineering discipline concerned with the chamber's physical structure — its walls, seals, wafer-handling hardware, and materials…

Etch Chamber Matching

chamber matching, chamber to chamber matching, etch chamber qualification, rf matching etch, matching network plasma etch, etch fleet matching, plasma impedance match, etch chamber impedance

Etch chamber matching is the RF impedance network that presents 50 Ω to the generator while the plasma it drives fluctuates between 3 and 8 Ω of real resistance and up to 120 Ω…

Etch Reactor Software Design

recipe management semiconductor equipment, safety interlock software fab, process data logging traceability, tool controller software, wafer process recipe execution

The software design of an etch reactor is the layer of code running on the tool controller and its connected systems that actually interprets a process recipe and drives every…

Endpoint Detection Etch Explained

optical emission spectroscopy etch, endpoint algorithm semiconductor, etch stop detection, plasma etch process control, real time etch monitoring

Endpoint algorithms are the real-time detection systems that tell a plasma etch tool exactly when to stop etching, and getting that timing right is just as critical as every other…

Edge Placement Error

Edge placement error, or EPE, is the total deviation between where a feature's edge is actually formed on a chip and where it was intended to be, combining both lithography…