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Glossary

3,538 technical terms and definitions

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Scattering Bar

lithography

A scattering bar is the most common type of sub-resolution assist feature (SRAF) — a thin line placed on the photomask parallel to and near a main feature to improve its imaging…

Scatterometry

optical scatterometry, semiconductor scatterometry, grating scatterometry

Optical critical-dimension scatterometry infers the average geometry of a periodic semiconductor pattern from how that pattern changes reflected or diffracted light. The tool may…

Scatterometry

euv scatterometry, euv metrology, actinic scatterometry, lithography metrology

EUV Scatterometry is the optical metrology technique that uses extreme ultraviolet light at 13.5 nm wavelength to measure critical dimensions, overlay, and film properties…

Scatterometry CD Measurement

inline cd measurement, optical profile metrology, scatterometry sidewall angle

Optical critical-dimension scatterometry infers the average geometry of a periodic semiconductor pattern from how that pattern changes reflected or diffracted light. The tool may…

Scatterometry Ocd

ocd scatterometry, optical critical dimension scatterometry, inline ocd metrology

Optical critical-dimension scatterometry infers the average geometry of a periodic semiconductor pattern from how that pattern changes reflected or diffracted light. The tool may…

Scatterometry Overlay

metrology, diffraction-based overlay, spectroscopic overlay, micro-DBO, 2D grating target, swing curve, overlay throughput, in-die overlay target, optical overlay measurement

Scatterometry overlay measures how precisely two patterned layers line up by analyzing the spectral signature light produces when it reflects or diffracts off a specialized…

Schottky Barrier

Fermi level pinning, metal semiconductor junction, thermionic emission tunneling, contact resistance metal choice, Schottky diode fast switching, sub-5nm contact engineering, titanium TiN contact

A Schottky barrier is the potential energy barrier that forms at the interface between a metal and a semiconductor, and in the simplest ideal picture its height is set by…

Schottky Barrier Diode Sbd

schottky contact metal, forward voltage drop schottky, schottky rectifier speed, barrier height metal semiconductor

A Schottky barrier diode swaps the p-n junction's two doped semiconductor regions for a single metal-semiconductor interface, and that one substitution changes almost everything…

Schrödinger Equation

time dependent schrodinger equation, stationary schrodinger equation, quantum wave equation, schrodinger equation numerical methods, schrodinger equation semiconductor, device quantum wave solver

The Schrödinger equation governs the coherent evolution of nonrelativistic quantum states and, in its stationary form, defines the energy eigenstates of a specified Hamiltonian.…

Scrap Wafer

production

A scrap wafer is a non-product wafer used for process testing, equipment qualification, or experimental runs where the wafer will not become saleable product. Types: Previously…

Scribe Line Test Structures

metrology

Spectroscopic ellipsometry and inline optical wafer metrology constitute the non-destructive physical measurement and defect detection disciplines that govern yield control across…

Seasoning Wafer Requirements

production

Seasoning wafer requirements is the defined number and type of conditioning wafers needed to stabilize chamber surfaces before product processing - proper seasoning establishes…

Seasoning Wafers

production

Seasoning Wafers are non-product wafers run through process equipment to condition the chamber or tool after maintenance, idle time, or recipe changes — restoring the tool's…

Secondary Ion Mass Spectrometry Depth Profile

sims dopant profile, quantitative sims, sims depth calibration, sims metrology

Secondary ion mass spectrometry (SIMS) builds an elemental or isotopic depth profile by bombarding a sample with primary ions, detecting a small fraction of the sputtered material…

Selective Area Deposition Defect Prediction Machine Learning

selective area deposition defect prediction, selective area deposition, area deposition defect, deposition defect prediction, selective area, area deposition, deposition defect

Selective Area Deposition Defect Prediction with Machine Learning Introduction & Motivation Selective Area Deposition Defect Prediction with Machine Learning addresses a central…

Selective Deposition

area selective deposition, asd, selective ald, surface selective growth

Selective Deposition (Area-Selective Deposition, ASD) is the technique of depositing material only on specific surfaces while avoiding growth on adjacent surfaces — eliminating…

Selective Deposition Area Selective

area selective ald, surface functionalization selective, bottom up selective deposition, inhibitor selective growth

Area-Selective Deposition (ASD) is the advanced thin-film technique where material is deposited preferentially on one surface type (e.g., metal) while avoiding deposition on…

Selective Deposition Techniques

area selective deposition, self aligned deposition, bottom up fill, selective cvd

Selective Deposition Techniques are the processes that deposit material only on specific surfaces or regions while preventing deposition on others — enabling self-aligned…